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Datasheet: I74F776N (Philips Semiconductors)

Pi-bus transceiver

 

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Philips Semiconductors
Philips
Semiconductors
74F776
Pi-bus transceiver
Product specification
IC15 Data Handbook
1990 Dec 19
INTEGRATED CIRCUITS
Philips Semiconductors
Product specification
74F776
Pibus transceiver
2
December 19, 1990
853 1121 01321
FEATURES
Octal latched transceiver
Drives heavily loaded backplanes with equivalent load impedances
down to 10 ohms
High drive (100mA) open collector drivers on B port
Reduced voltage swing (1 volt) produces less noise and reduces
power consumption
High speed operation enhances performance of backplane buses
and facilitates incident wave switching
Compatible with Pibus and IEEE 896 Futurebus standards
Builtin precision bandgap reference provides accurate receiver
thresholds and improved noise immunity
Controlled output ramp and multiple GND pins minimize ground
bounce
Glitchfree power up/power down operation
Multiple package options
Industrial temperature range available (40
C to +85
C)
DESCRIPTION
The 74F776 is an octal bidirectional latched transceiver and is
intended to provide the electrical interface to a high performance
wiredOR bus. The B port inverting drivers are lowcapacitance open
collector with controlled ramp and are designed to sink 100mA from 2
volts. The B port inverting receivers have a 100 mV threshold region
and a 4ns glitch filter.
The 74F776 B port interfaces to 'Backplane Transceiver Logic' (BTL).
BTL features a reduced (1V to 2V) voltage swing for lower power
consumption and a series diode on the drivers to reduce capacitive
loading. Incident wave switching is employed, therefore BTL
propagation delays are short. Although the voltage swing is less for
BTL, so is its receiver threshold, therefore noise margins are excellent.
BTL offers low power consumption, low ground bounce, EMI and
crosstalk, low capacitive loading, superior noise margin and low
propagation delays. This results in a high bandwidth, reliable
backplane.
The 74F776 A port has TTL 3state drivers and TTL receivers with a
latch function. A separate highlevel control voltage input (V
X
) is
provided to limit the A side output level to a given voltage level (such
as 3.3V). For 5.0V systems, V
X
is simply tied to V
CC
.
The 74F776 has a designed feature to control the B output transitions
during power sequencing. There are two possible sequencing, They
are as follows:
1.When LE = low and OEBn = low then the B outputs are disabled until
the LE circuitry takes control. Then the B outputs will follow the A inputs,
making a maximum of one transition during powerup (or down).
2. If LE = high or OEBn = high then the B outputs will be disabled during
powerup (or down).
TYPE
TYPICAL PROPAGA-
TION DELAY
TYPICAL SUPPLY
CURRENT( TOTAL)
74F776
6.5ns
80mA
ORDERING INFORMATION
ORDER CODE
COMMERCIAL RANGE
INDUSTRIAL RANGE
DESCRIPTION
V
CC
= 5V
10%, T
amb
= 0
C to +70
C
V
CC
= 5V
10%, T
amb
= 40
C to +85
C
PKG DWG #
28pin plastic DIP (600 mil)
N74F776N
I74F776N
SOT117-2
28pin PLCC
N74F776A
I74F776A
SOT261-2
INPUT AND OUTPUT LOADING AND FAN OUT TABLE
PINS
DESCRIPTION
74F (U.L.)
HIGH/LOW
LOAD VALUE
HIGH/LOW
A0 A7
PNP latched inputs
3.5/0.117
70
A/70
A
B0 B7
Data inputs with threshold circuitry
5.0/0.167
100
A/100
A
OEA
A output enable input (active high)
1.0/0.033
20
A/20
A
OEB0, OEB1
B output enable inputs (active low)
1.0/0.033
20
A/20
A
LE
Latch enable input (active low)
1.0/0.033
20
A/20
A
A0 A7
3state outputs
150/40
3mA/24mA
B0 B7
Open collector outputs
OC/166.7
OC/100mA
Notes to input and output loading and fan out table
One (1.0) FAST unit load is defined as: 20
A in the high state and 0.6mA in the low state.
OC = Open collector.
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
3
PIN CONFIGURATION
1
2
3
4
5
6
7
8
9
10
19
20
21
22
23
24
25
26
27
28
VCC
11
12
13
14
15
16
17
18
LE
B0
B1
GND
B2
B3
GND
B4
B5
B6
GND
B7
OEB1
OEB0
OEA
A0
GND
A1
A2
A3
GND
A4
A5
GND
A6
A7
VX
SF00422
PIN CONFIGURATION PLCC
4
3
2
1
28
27
25
24
23
22
21
20
11
10
9
8
7
6
18
16
17
15
14
13
26
19
12
5
PLCC
A1
A2
A3
GND
A4
A5
GND
VCC
OEA
A0
GND
LE
B0
B1
GND
OEB0
B7
VX
A7
A6
OEB1
GND
B2
B3
GND
B4
B5
B6
SF00423
IEC/IEEE SYMBOL
2
3
&
EN2
EN1
EN3
ID
27
26
24
23
21
20
19
17
5
6
7
9
10
12
13
3
15
16
28
2
SF00424
LOGIC SYMBOL
VCC = Pin 1, VX = Pin 14
GND = Pin 4, 8, 11, 18, 22, 25
15
2
28
16
OEB0
OEA
LE
OEB1
B0 B1 B2 B3 B4 B5 B6 B7
27 26 24 23 21 20 19 17
3
5
6
7
9
10 12 13
A0 A1 A2 A3 A4 A5 A6 A7
SF00425
PIN DESCRIPTION
SYMBOL
PINS
TYPE
NAME AND FUNCTION
A0 A7
3, 5, 6, 7, 9, 10, 12, 13
I/O
PNP latched input/3state output (with V
X
control option)
B0 B7
27, 26, 24, 23, 21, 20, 19, 17
I/O
Data input with special threshold circuitry to reject noise/ open collector output, high
current drive
OEB0
15
Input
Enables the B outputs when both pins are low
OEB1
16
Input
OEA
2
Input
Enables the A outputs when high
LE
28
Input
Latched when high (a special feature is built in for proper enabling times)
V
X
14
Input
Clamping voltage keeping V
OH
from rising above V
X
(V
X
= V
cc
for normal use)
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
4
LOGIC DIAGRAM
LE
B0
OEB0
Data
Q
27
3
LE
OEA
VCC = Pin 1, VX
= Pin 14,
GND = Pin 4, 8, 11, 18, 22, 25
A0
LE
B1
Data
Q
26
5
A1
LE
B2
Data
Q
24
6
A2
LE
B3
Data
Q
23
7
A3
LE
B4
Data
Q
21
9
A4
LE
B5
Data
Q
20
10
A5
LE
B6
Data
Q
19
12
A6
LE
B7
Data
Q
17
13
A7
28
2
16
15
OEB1
SF00426
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
5
FUNCTION TABLE
INPUTS
LATCH
OUTPUTS
OPERATING MODE
An
Bn*
LE
OEA
OEB0
OEB1
STATE
An
Bn
H
X
L
L
L
L
H
Z
Z
A 3state, data from A to B
L
X
L
L
L
L
L
Z
L
X
X
H
L
L
L
Qn
Z
Qn
A 3state, latched data to B
L
H
L
L
(1)
(1)
(1)
Feedback: A to B, B to A
H
H
H
L
L
H (2)
H
Z(2)
Preconditioned latch enabling data transfer from B to A
L
H
H
L
L
H (2)
L
Z(2)
H
H
L
L
Qn
Qn
Qn
Latch state to A and B
H
X
L
L
H
X
H
Z
Z
L
X
L
L
H
X
L
Z
Z
B and A 3state
X
X
H
L
H
X
Qn
Z
Z
H
L
H
H
X
H
H
Z
L
L
H
H
X
L
L
Z
B 3state, data from B to A
H
H
H
H
X
Qn
H
Z
L
H
H
H
X
Qn
L
Z
H
X
L
L
X
H
H
Z
Z
L
X
L
L
X
H
L
Z
Z
B and A 3state
X
X
H
L
X
H
Qn
Z
Z
H
L
H
X
H
H
H
Z
L
L
H
X
H
L
L
Z
B 3state, data from B to A
H
H
H
X
H
Qn
H
Z
L
H
H
X
H
Qn
L
Z
Notes to function table
H = High voltage level
L
= Low voltage level
X = Don't care
= Input not externally driven
Z = High impedance "off" state
Q
n
= High or Low voltage level one setup time prior to the lowtohigh LE transition.
(1) = Condition will cause a feedback loop path: A to B and B to A.
(2) = The latch must be preconditioned such that B inputs may assume a high or low level while OEB0 and OEB1 are low and LE is high.
B* = Precaution should be taken to insure the B inputs do not float. If they do they are equal to low state.
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
6
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limit set forth in this table may impair the useful life of the device. Unless otherwise noted these limits are over the
operating free air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
Supply voltage
0.5 to +7.0
V
V
X
Threshold control
0.5 to +7.0
V
V
IN
Input voltage
OEBn, OEA, LE
0.5 to +7.0
V
A0
A7, B0
B7
0.5 to +5.5
V
I
IN
Input current
40 to +5
mA
V
OUT
Voltage applied to output in high output state
0.5 to V
CC
V
I
OUT
Current applied to output in low output state
A0
A7
48
mA
B0
B7
200
mA
T
amb
Operating free air temperature range
Commercial range
0 to +70
C
Industrial range
40 to +85
C
T
stg
Storage temperature range
65 to +150
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
MIN
NOM
MAX
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
Highlevel input voltage
Except B0 B7
2.0
V
B0 B7
1.6
V
V
IL
Lowlevel input voltage
Except B0 B7
0.8
V
B0 B7
1.45
V
I
Ik
Input clamp current
Except A0 A7
18
mA
A0 A7
40
mA
I
OH
Highlevel output current
A0 A7
3
mA
I
OL
Lowlevel output current
A0 A7
24
mA
B0 B7
100
mA
T
amb
Operating free air temperature
range
Commercial range
0
+70
C
range
Industrial range
40
+85
C
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
7
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST
LIMITS
UNIT
CONDITIONS
1
MIN
TYP
2
MAX
I
OH
Highlevel output current
B0 B7
V
CC
= MAX, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
100
A
I
OFF
Poweroff output current
B0 B7
V
CC
= 0.0V, V
IL
= MAX, V
IH
= MIN, V
OH
= 2.1V
100
A
V
CC
= MIN,
I
OH
= 3mA, V
X
=V
CC
2.5
V
CC
V
V
OH
High-level output voltage
A0 A7
4
V
IL
= MAX, V
IH
= MIN
I
OH
= 4mA,
V
X
=3.13V and 3.47V
2.5
V
A0 A7
4
V
CC
= MIN,
I
OL
= 20mA, V
X
= V
CC
0.50
V
V
OL
Low-level output voltage
B0 B7
V
IL
= MAX
I
OL
= 100mA
1.15
V
V
IH
= MIN
I
OL
= 4mA
0.40
V
V
IK
Input clamp voltage
A0 A7
V
CC
= MIN, I
I
= I
IK
-0.5
V
Except A0 A7
V
CC
= MIN, I
I
= I
IK
-1.2
V
I
I
Input current at
OEBn, OEA, LE
V
CC
= 0.0V, V
I
= 7.0V
100
A
maximum input voltage
A0 A7, B0 B7
V
CC
= MAX, V
I
= 5.5V
1
mA
I
IH
Highlevel input current
OEBn, OEA, LE
V
CC
= MAX, V
I
= 2.7V, Bn An =0V
20
A
B0 B7
V
CC
= MAX, V
I
= 2.1V
100
A
I
IL
Lowlevel input current
OEBn, OEA, LE
V
CC
= MAX, V
I
= 0.5V
20
A
B0 B7
V
CC
= MAX, V
I
= 0.3V
100
A
I
OZH
+ I
IH
Off state output current,
high level voltage applied
A0 A7
V
CC
= MAX, V
O
= 2.7V
70
A
I
OZL
+ I
IL
Off state output current,
low level voltage applied
A0 A7
V
CC
= MAX, V
O
= 0.5V
70
A
I
X
Highlevel control current
V
CC
= MAX, V
X
= V
CC
, LE = OEA
= OEBn
=
2.7V, A0 A7 = 2.7V, B0 B7 = 2.0V,
100
100
A
V
CC
= MAX, V
X
= 3.13 & 3.47V, LE = OEA
=
2.7V, OEBn
= A0 A7 = 2.7V, B0 B7 = 2.0V,
10
10
A
I
OS
Short circuit output
current
3
A0 A7
only
V
CC
= MAX, Bn = 1.8V, OEA = 2.0V,
OEBn
= 2.7V
-60
-150
mA
I
CCH
V
CC
= MAX
65
100
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX, V
IL
= 0.5V
100
145
mA
I
CCZ
75
100
mA
Notes to DC electrical characteristics
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
Unless otherwise specified, V
X
= V
CC
for all test conditions.
2. All typical values are at V
CC
= 5V, T
amb
= 25
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a high output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
4. Due to test equipment limitations, actual test conditions are for V
IH
=1.8v and V
IL
= 1.3V.
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
8
AC ELECTRICAL CHARACTERISTICS
A PORT LIMITS
T
amb
= +25
C
T
amb
= 0
C to
+70
C
T
amb
= 40
C to +85
C
SYMBOL
PARAMETER
TEST
V
CC
= +5.0V
V
CC
= +5.0V
10%
V
CC
= +5.0V
10%
UNIT
CONDITION
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
MIN
TYP
MAX
MIN
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
Bn
to An
Waveform 1
5.5
4.5
8.0
6.0
12.0
9.0
5.5
4.5
12.0
9.0
5.5
4.5
12.0
9.0
ns
t
PZH
t
PZL
Output enable time to high
or low, OEA
to An
Waveform 3, 4
8.0
8.5
10.5
11.0
13.5
13.5
7.5
8.0
15.0
15.5
7.5
8.0
15.5
15.5
ns
t
PHZ
t
PLZ
Output disable time from
high or low, OEA
to An
Waveform 3, 4
2.0
2.0
3.5
4.5
6.0
7.0
1.5
2.0
6.5
7.5
1.5
2.0
6.5
7.5
ns
B PORT LIMITS
TEST
T
amb
= +25
C
T
amb
= 0
C to
+70
C
T
amb
= 40
C to +85
C
SYMBOL
PARAMETER
CONDITION
V
CC
= +5.0V
V
CC
= +5.0V
10%
V
CC
= +5.0V
10%
UNIT
C
D
= 30pF, R
U
= 9
C
D
= 30pF, R
U
= 9
C
D
= 30pF, R
U
= 9
MIN
TYP
MAX
MIN
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
An
to Bn
Waveform 1
3.0
3.0
5.0
4.5
7.0
7.5
2.5
2.5
8.0
8.5
2.0
2.5
9.0
8.5
ns
t
PLH
t
PHL
Propagation delay
LE
to Bn
Waveform 1
3.5
3.5
5.0
5.0
8.0
8.0
3.0
2.5
9.0
9.0
2.5
2.5
9.5
9.5
ns
t
PLH
t
PHL
Enable/disable time
OEBn
to An
Waveform 1
3.0
3.5
4.5
5.5
7.0
9.0
2.5
3.5
8.0
10.0
2.5
3.5
8.5
10.5
ns
t
TLH
t
THL
Transition time, B port
1.3V to 1.7V, 1.7V to 1.3V
Test Circuit and
Waveforms
0.5
0.5
2.0
2.0
4.5
4.5
0.5
0.5
5.0
4.5
0.5
0.5
5.0
4.5
ns
AC SETUP REQUIREMENTS
LIMITS
TEST
T
amb
= +25
C
T
amb
= 0
C to +70
C
T
amb
= 40
C to +85
C
SYMBOL
PARAMETER
CONDITION
V
CC
= +5.0V
V
CC
= +5.0V
10%
V
CC
= +5.0V
10%
UNIT
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
C
L
= 50pF,
R
L
= 500
MIN
TYP
MAX
MIN
MAX
MIN
MAX
t
su
(H)
t
su
(L)
Setup time, high or low
An
to LE
Waveform 2
3.5
4.5
4.5
5.0
4.5
5.0
ns
t
h
(H
)
t
h
(
L
)
Hold time, high or low
An
to LE
Waveform 2
0.0
0.0
0.0
0.0
0.0
0.0
ns
t
w
(L)
LE pulse width, low
Waveform 2
4.0
5.0
5.0
ns
AC WAVEFORMS
V
M
V
M
V
M
V
M
An, Bn
An, Bn, OEBn
t
PLH
t
PHL
SF00427
Waveform 1. Propagation delay for data to output
LE
V
M
V
M
V
M
V
M
V
M
V
M
t
su
(L)
t
h
(L)
t
h
(H)
An
V
M
t
w
(L)
t
s
(H)
SF00428
Waveform 2. Data setup and hold times and LE pulse width
Philips Semiconductors
Product specification
74F776
Pibus transceiver
December 19, 1990
9
AC WAVEFORMS (Continued)
V
M
V
M
V
M
t
PHZ
t
PZH
V
OH
-0.3V
0V
OEA
An
SF00429
Waveform 3. 3-state output enable time to high level and output
disable time from high level
V
M
V
M
V
M
t
PLZ
t
PZL
V
OL
+0.3V
OEA
An
SF00430
Waveform 4. 3-state output enable time to low level and output
disable time from low level
Notes to AC waveforms
For all waveforms, V
M
= 1.5V.
The shaded areas indicate when the input is permitted to change for predictable output performance.
TEST CIRCUIT AND WAVEFORMS
tw
90%
VM
10%
90%
VM
10%
90%
VM
10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
low V
low V
tTHL (tf
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz
500ns 2.5ns
2.5ns
Input pulse definition
VCC
family
A port
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN
VOUT
Test circuit for 3State outputs on A port
DEFINITIONS:
R
L
= Load resistor; see AC electrical characteristics for value.
C
L
= Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value.
R
U
= Pull up resistor; see AC electrical characteristics for value.
C
D
= Load capacitance includes jig and probe capacitance; see AC electrical characteristics for value.
R
T
= Termination resistance should be equal to Z
OUT
of pulse generators.
tTHL (tf
)
tTLH (tr
)
tTLH (tr
)
AMP (V)
amplitude
3.0V
1.5V
V
M
RL
7.0V
VCC
D.U.T.
PULSE
GENERATOR
CD
RT
VIN
VOUT
Test circuit for outputs on B port
RU
7.0V
1MHz
500ns
B port
2.0V
1.0V
4.0ns
4.0ns
Low V
0.0V
1.0V
SWITCH POSITION
TEST
SWITCH
closed
open
All other
t
PLZ
, t
PZL
SF00431
Philips Semiconductors
Product specification
74F776
Pi-bus transceiver
1990 Dec 19
10
DIP28:
plastic dual in-line package; 28 leads (600 mil); long body
SOT117-2
Philips Semiconductors
Product specification
74F776
Pi-bus transceiver
1990 Dec 19
11
PLCC28:
plastic leaded chip carrier; 28 leads
SOT261-2
Philips Semiconductors
Product specification
74F776
Pi-bus transceiver
yyyy mmm dd
12
Definitions
Short-form specification -- The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition -- Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information -- Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support -- These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes -- Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 940883409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print code
Date of release: 10-98
Document order number:
9397-750-05177
Philips
Semiconductors
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition
[1]
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
Data sheet status
[1]
Please consult the most recently issued datasheet before initiating or completing a design.
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